We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Thickness measuring instrument.
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Thickness measuring instrument - Company Ranking(22 companies in total)

Last Updated: Aggregation Period:Jun 03, 2026〜Jun 30, 2026
This ranking is based on the number of page views on our site.

Company Name Featured Products
Product Image, Product Name, Price Range overview Application/Performance example
Equipped with a barcode reader and laser marking reading function, it can save the scanned barcode numbers, two-dimensional codes, or text i... We have received orders from the semiconductor industry.
- The manual handle and scale allow for measurement at a designated position. - The wafer is fixed on the stage by vacuum suction, preventin... We have received orders from the semiconductor industry.
- Before measurement, the sensor uses a calibration gauge for automatic calibration. - The measurement location and number of measurement po... Measurement of Si wafer thickness and front/back surface P/N determination.
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  1. Featured Products
    Wafer thickness measurement device (TMR)Wafer thickness measurement device (TMR)
    overview
    Equipped with a barcode reader and laser marking reading function, it can save the scanned barcode numbers, two-dimensional codes, or text i...
    Application/Performance example
    We have received orders from the semiconductor industry.
    Manual Wafer Thickness Measurement Device (Model STM-06)Manual Wafer Thickness Measurement Device (Model STM-06)
    overview
    - The manual handle and scale allow for measurement at a designated position. - The wafer is fixed on the stage by vacuum suction, preventin...
    Application/Performance example
    We have received orders from the semiconductor industry.
    P/N judgment, resistivity measurement sorting machine (CJT-01 type)P/N judgment, resistivity measurement sorting machine (CJT-01 type)
    overview
    - Before measurement, the sensor uses a calibration gauge for automatic calibration. - The measurement location and number of measurement po...
    Application/Performance example
    Measurement of Si wafer thickness and front/back surface P/N determination.